New Package Significantly Improves Optical CD Measurement Quality

Nova Measuring Instruments Ltd. (NASDAQ: NVMI) provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, today announced the launching of MatMaker(TM), a Product-Driven Materials Characterization package which revolutionizes one of the most critical elements of Optical CD measurement. Last week the Company announced all time record orders for its stand-alone Optical CD product and the addition of the MatMaker(TM) Package is intended to further solidify the Company's position in the market. Spectral Optical CD technologies need material optical properties (spectral n&k) to interpret the optical spectrum into a profile measurement. Until today the industry standard was to measure material properties on blanket wafers, layer by layer, a... [read full story]                    

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